FOCUSED MICROPROBES OF HIGH ENERGY IONS VERSATILE ANALYTICAL PROBES FOR SURFACES, INTERFACES AND DEVICES

02-Sep-99


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Table of Contents

FOCUSED MICROPROBES OF HIGH ENERGY IONS VERSATILE ANALYTICAL PROBES FOR SURFACES, INTERFACES AND DEVICES

Outline

Facilities of the Centre

Photons and MeV ions interact with matter

keV electrons and MeV ions interact with matter

Analysis modes

Nuclear microprobe essential components

Melbourne Nuclear Microprobe System

New Lenses

Chamber inside

Nuclear Microprobe Laboratories in the World

Analysis modes

Surface contamination in synthetic diamond

IL identifies defects

IL: Poly-diamond detector material (Norton)

Electron Emission from Surfaces

Filoform Corrosion in Aluminium

Stoichimetry of Oxidised Filoform

Thickness of Oxidised Filoform

Trace element contamination in solar cells

Quantitiative analysis with IBIC

Sources of recombination in IBIC: Energy level view

IBIC with heavy ions: 15 MeV Si & C

IBIC - 2 MeV He / 1 MeV H

2 MeV H IBIC on Solar Cells

Review of prior H ERDA work

Hydrogen in Solar Cell Material

Selected new quadrupole systems

The CSIRO Quintuplet: 1999

Conclusions

Author: David N. Jamieson

Email: dnj@physics.unimelb.edu.au

Home Page: http://www.ph.unimelb.edu.au/~dnj