Jeol AFM/STM scaning probe system  


This instrument is designed for the analysis and imaging of surfaces under UHV conditions. Since the system was commissioned in 1999, atomic resolution has been obtained on a routine basis and several major projects are underway.

The features of the system are:

AFM & STM modes

Preparation chamber with ion sputtering

In-situ ion bombardment

In-situ sample cleavage provision for analysis of fresh surfaces

Auxiliary STM for preliminary analysis under ambient or vacuum


Created: 21 Feb, 2003
Last modified: 13 March 2003
Authorised by: Prof. David Jamieson
Maintained by: MARC office admin., Physics Department